About our process
As atomic force microscopes continue to enter more and more areas of applications, especially in industry, production processes and quality control, standard AFM systems are often not suitable for the task at hand. For these cases, when you need the AFM to be fully integrated in a process, or your samples are too large for standard setups, Nanosurf offers the unique service of designing and developing custom AFM systems and stages that will allow you to perform your measurements with minimal disruption of your established process.
In close cooperation and in continuous dialog with you, our instrument development team will design and construct a system tailored to your exact needs. Contact us with a first description of your needs and we'll be happy to get back to you to discuss your project in depth.
After you first contact us with a request for a customization project, we organize a kick-off meeting with your project team and our engineers to fully understand your requirements. Based on this, Nanosurf develops a solution concept and prepares a quotation. The next step is a joint discussion of our solution concept. When you place your order based on the concept and quotation, our engineers develop your solution and build it in close collaboration with our partners. Finally, we test the system, deliver and install it at your facility.
Over the years of designing custom AFM-based systems, Nanosurf has now has unparalleled experience when it comes to highly complex solutions. The Industrial Solutions business unit has grown to a team of 12 highly skilled engineers, physicists, AFM experts and software developers. Example: Motorized XYZΦ translation stage.
Engineered to your requirements
Engineered for the quality control of large glass samples, this custom stage keeps all movement below the sample, mitigating the risk of contamination by abrasions in moving components. The manual change of the scan head position in two defined positions keeps the overall dimensions of the stage small while still allowing access to the whole sample under the same relative orientation.