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NaioAFM
NaioAFM
- All-in-one plug-and-play AFM system
- Famously easy to use
- All standard operating modes available
The NaioAFM is the ideal atomic force microscope for nanoeducation and basic research on small samples. This all-in-one AFM system provides solid performance and easy handling, with a price tag and footprint that fit anyone and any place.
| Scanner | |
|---|---|
| Max. scan range / scan height (resolution) (1) | 70 μm (1.0 nm) / 14 μm (0.2 nm) |
| Static / Dynamic RMS Z-noise | typ. 0.4 nm (max. 0.8 nm) / typ. 0.3 nm (max. 0.8 nm) |
| Max. sample size / height | 12 mm / 3.5 mm |
| Max. sample stage positioning range | 12 mm travel in each direction (6 mm from center to all sides) |
| Top view camera | 1.5 ×1 mm FOV, 4× digital zoom, 2 μm optical resolution, 2048×1536 pixels, in-axis LED illumination |
| Side view observation | 5×5 mm FOV, variable LED illumination (with optional side view camera: 2×2 mm FOV, 1280×1024 pixels) |
| Approach | 4 mm linear motor, continuous or step-bystep approach |
| (1) Manufacturing tolerances are ±10% | |
| Cantilever requirements | |
|---|---|
| Width | min. 28 μm |
| Length | min. 225 μm or XY corrected |
| Reflective coating | Required on complete cantilever |
| Liquid measurements | Not possible |
| Alignment grooves | Required |
| Resonance frequency dynamic mode | 15 kHz to 350 kHz |
| Cantilever shape | Single rectangular cantilevers only |
| Chip thickness | 300 μm |
