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LiteScope™
LiteScope AFM-in-SEM
Distributor & Service Provider In India
Inkarp Instruments, a trusted NenoVision partner, introduces the LiteScope Atomic Force Microscope (AFM)-in-SEM in India, revolutionizing nanoscale imaging.
Unique Atomic Force Microscope LiteScope is designed to merge the strengths of AFM and SEM techniques, resulting in effective workflow and extending the possibilities of correlative microscopy and in-situ analysis that ware difficult or almost impossible by conventional instrumentation.
Simultaneous AFM and SEM measurement allows nanometer precise data correlation, making LiteScope a powerful tool for a variety of fields such as Material science, Nanotechnology, Semiconductors, Life science and other areas of research and industry.
| Dimensions XYZ | 118 mm x 84 mm x 35.7-48.4 mm | Scan range in open loop XYZ (±10%) | 100 μm x 100 μm x 20 μm |
| Total weight | 460 g | Scan range in closed loop XYZ | 80 μm x 80 μm x 16 μm |
| Vacuum working range | 105 Pa to 10-5 Pa | Resolution XYZ up to | 0.2 nm x 0.2 nm x 0.04 nm |
| Operating temperature | +10 °C to +35 °C | Maximum sample height | 8 mm |
| Maximal scanned sample area XYZ | 21 mm x 11 mm x 8 mm | Maximum sample weight | 100 g |