Product Details


The leading solution for AFM in SEM

  • In situ AFM analysis in your SEM

  • Correlative AFM and SEM analysis

  • Compatible with most SEMs without impeding normal operation

  • Many analysis techniques in parallel to AFM and SEM

  • Intuitive handling

The combination of complementary techniques is a key success factor for gaining new insights into the micro and nano worlds. AFSEM™, offered by GETec and Nanosurf, enables you to easily combine two of the most powerful analysis techniques available — AFM and SEM — to greatly extend your correlative microscopy and analysis possibilities.

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