JPK Instruments

NanoWizard 4 NanoScience AFM

For applications in materials and polymer science ranging from nanomechanics and electrochemistry to electrical and magnetic measurements.

Key Features:

  • Fast scanning of up to 100 lines/sec and time per frame up to 3s for tracking dynamic processes
  • Atomic lattice resolution on inverted microscopes with a large scan field of 100×100×15 µm3
  • Outstanding high-resolution quantitative imaging made easy by QI™ Mode, for the most challenging of AFM samples
  • Industry-leading technology intergrating optical microscopy in real time
  • Unique solutions for the characterization of mechanical and electrical sample properties
  • Widest range of modes and accessories of any AFM

 



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